How real-time factory big data enables smarter decision making and performance with new opportunity.
Shows how to attach Kyowa strain gage to Intel® Ball Grid Array packages; measures board flexure.
Ensure consistent quality and minimize accidents with handling recommendations and practices.
Intel’s ESD prevention methods prevent costly damage to electronic devices.
PoP device rework demos thermal reflow profile, PCB pad site, and new component preparation.
Demos antenna and oscilloscope use for ESD detection, minimum tool requirements, and parameter setup.