Fab 17 ISO 9001:2008
Certifies that Intel Corporation—Fab 17 in Hudson, Massachusetts, complies with the ISO 9001:2008 requirements of wafer fabrication, associated equipment, and processes.
Read the full Fab 17 ISO 9001:2008 Certification.
Shows how to attach Vishay strain gage to Intel® Ball Grid Array packages; measures board flexure.
Reviews corner glue use, material selection criteria, and demos proper application techniques.
Intel’s ESD prevention methods prevent costly damage to electronic devices.
Demos antenna and oscilloscope use for ESD detection, minimum tool requirements, and parameter setup.
Ensure consistent quality and minimize accidents with handling recommendations and practices.
Shows how to attach Kyowa strain gage to Intel® Ball Grid Array packages; measures board flexure.